High Resolution XRD Service

High Resolution XRD Service

Bruker Discover D8 is an X-Ray Diffraction analysis system with multi-functions. Besides polycrystalline and single crystal analysis, this system is equipped with an analyzer crystal, it is able to resolve with high resolution the angular distribution of the beam diffracted by the sample. Such a diffraction scheme is called triple-crystal or triple-axis diffraction set up. This system is able to provide the information of crystallinity, composition or concentration and Reciprocal Space Mapping (RSM) analysis. In addition, we can measure the film thickness, roughness, and electron density on multi-layers sample by X-Ray Reflection (XRR) function. The method can also be done for amorphous layer. The maximum thickness of thin film or multi-layers is 300nm and the maximum film roughness is 5nm with XRR method.





Application

  • High resolution XRD analysis with triple crystal
  • Crystallinity analysis
  • Grain size analysis
  • XRR Analysis for single/ multi-layers film thickness,
  • roughness and density
  • Composition analysis of compound film
  • Grazing Angle Diffraction Analysis (GID)
  • Powder X-Ray Diffraction Analysis (XRD)
  • Crystal structure & phase identification
  • Crystal lattice parameters analysis
  • Thin film phase identification
  • Plating, coating, and deposition film analysis
  • Surface oxide phase identification
  • Corrosion studies on metals
  • RSM analysis

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